ICIEA 2023 Special Session

SS14: Smart inspection for microelectronics, manufacturing and biomedical sectors

Organized by:

Organizer 1: JIANG Lijun, David

Email: davidjiang2007@gmail.com, jiang_lijun@rp.edu.sg

Affiliation: Republic Polytechnic, Singapore

Organizer 2: Zhang Jianmin

Email: zhangjm@jhun.edu.cn; ean_young554@yahoo.com

Affiliation: Jianghan Unviersity, Wuhan, China

Summary of session:

With the rapid development of AI, computer vision is driven to be used in more industry detection areas such as microelectronics, manufacture and biomedical sectors. The focus of this special session is to collect emerging research achievements within the scope of vision based smart inspection.

Topics of interest for submission include, but are not limited to:

• AI based defects detection
• Camera/borescope tracking during inspection
• Intelligent diagnosis based on image and video
• Wafer/IC chip surface defect detection
• Signal & Image Processing methods and algorithms
• Deep learning-based computer vision and signal processing
• Digital NDT
• Data processing